A Comparative Overview of Electronic Devices Reliability Prediction Methods-Applications and Trends

  • Frederick Ojiemhende Ehiagwina Federal Polytechnic, Offa http://orcid.org/0000-0002-1527-4376
  • Titus Olugbenga Adewunmi Federal Polytechnic, Offa
  • Emmanuel Oludare Seluwa Federal Polytechnic, Offa
  • Olufemi Oluseye Kehinde Federal Polytechnic, Offa
  • Nafiu Sidiq Abubakar Federal Polytechnic, Offa
Keywords: Bellcore TR-332, Empirical Methods, Life Test, MIL-HDBK-217F, Physics of Failure, RDF 2000, Reliability Prediction, Telcordia SR-332

Abstract

 

Reliability prediction is vital in the conception, definition, design, development, operation and maintenance phase of electronic devices. It is needed at various system levels and degrees of detail, in order to evaluate, determine and improve the dependability measures of an item when designing electronic devices in view of the high level competition among device manufacturers. Different reliability prediction methods or models are available for electronic devices. This paper comparatively examined the commonly used methods such as empirically based failure rate modeling methodologies used in reliability prediction handbooks, and physics of failure (PoF) based models. Three empirical approaches such as MIL-HDBK-217F – a conservative standard applicable principally to military equipment, and Bellcore TR-332/Telcordia SR-332, which are applicable to commercial devices are reviewed in closer details. Also reviewed is Recueil de Donnes de Fiabilite (RDF) 2000, used in Telecom industry. Some PoF based methods such as Arrhenius law; Eyring model, Black Model for Electromigration, and Coffin Manson Model for fatigue are also examined. Additionally, the respective merits and demerits of the prediction methods which provide the basis for use are noted. The paper also attempts to highlight future trends and challenges in RP of electronic devices.

Author Biographies

Frederick Ojiemhende Ehiagwina, Federal Polytechnic, Offa
Lecturer in the Department of Electrical and Electronics Engineering, Federal Polytechnic, Offa
Titus Olugbenga Adewunmi, Federal Polytechnic, Offa
Lecturer in the Department of Electrical and Electronics Engineering, Federal Polytechnic, Offa
Emmanuel Oludare Seluwa, Federal Polytechnic, Offa
Lecturer in the Department of Electrical and Electronics Engineering, Federal Polytechnic, Offa
Olufemi Oluseye Kehinde, Federal Polytechnic, Offa
Lecturer in the Department of Electrical and Electronics Engineering, Federal Polytechnic, Offa
Nafiu Sidiq Abubakar, Federal Polytechnic, Offa
Lecturer in the Department of Electrical and Electronics Engineering, Federal Polytechnic, Offa

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Published
2017-01-13
How to Cite
Ehiagwina, F., Adewunmi, T., Seluwa, E., Kehinde, O., & Abubakar, N. (2017). A Comparative Overview of Electronic Devices Reliability Prediction Methods-Applications and Trends. Majlesi Journal of Telecommunication Devices, 5(4). Retrieved from http://journals.iaumajlesi.ac.ir/td/index/index.php/td/article/view/362
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Articles